| 8 | | * update pmFPAGenerateMasks to treat a missing GAIN as 1.0, not nan. |
| 9 | | * re-run dark analysis |
| 10 | | * generate master flats from new flat data |
| 11 | | * run darkmask and flatmask |
| 12 | | * update masks manually (all hands on deck) |
| 13 | | * commit psphot changes fixing CR masking segfaults |
| 14 | | * tweak source size parameters |
| 15 | | * merge branches/eam_branch/20091201 into trunk |
| | 8 | * finish work on the kernels as a function of input IQ (PAP - done?) |
| | 9 | * demo test through magic with full updated code + updated detrends (PAP / HAF) |
| | 10 | |
| | 11 | * double-check the masks / comparison with old masks (HAF / CZW) |
| | 12 | * check on excess source detections in flatcorr.20100124 chips (CZW) |
| | 13 | * generate the y-band master fringe frame (req. flat-field corrections in y) (CZW) |
| | 14 | |
| | 15 | * update ppImage to apply PATTERN to specific chips/cells only (PAP) |
| | 16 | * update the camera format to recognize the 'raw' temperature values for the near term. (PAP) |
| | 17 | * update camera format / camera config to have the 'PATTERN' applied in full to data pre-Dec 9 (PAP -- ok after Wed) |
| | 18 | |
| | 19 | * psphot work: |
| | 20 | * update the CR masking code to be faster (using pointers, not psImageGet/Set) (EAM) |
| | 21 | * update the source size classifications to limit the number of candidates CRs (limit by brightness?) (EAM) |
| | 22 | * limit max source detections is psphot (EAM) |
| | 23 | * finish other psphot mods (perhaps after Wed & merge) (EAM) |
| | 24 | * merge our working branch into the mainline (PAP / EAM) |
| | 25 | |
| | 26 | * apply the new darks, flats, masks to the flat-field calibration data and generate flat-corrections |
| | 27 | * check on results / fix errors / finish (EAM) |
| | 28 | * apply the updated flat corrections to the flats (EAM) |
