Changeset 28683

Timestamp:

Jul 16, 2010, 7:00:45 AM (16 years ago)

Author:

eugene

Message:

some notes on work needed

Location:

branches/eam_branches/ipp-20100621

Files:

• Ohana/src/relastro/doc/notes.txt (modified) (1 diff)
• Ohana/src/relastro/src/load_catalogs.c (modified) (1 diff)
• Ohana/src/relastro/src/relastro.c (modified) (1 diff)
• psphot/doc/notes.20100715.txt (added)
• psphot/src/Makefile.am (modified) (1 diff)
• psphot/src/psphotPSFConvModel.c (modified) (1 diff)

branches/eam_branches/ipp-20100621/Ohana/src/relastro/doc/notes.txt

@@ +1 @@
+
+2010.07.15
+
+  Some issues:
+
+  * when I apply the fitted image parameters (UpdateObjectOffsets), I
+    currently check for good/bad fits and warn if the image is bad.
+    But the correction requires multiple re-loads of the catalog
+    tables.
+
+  * I would like to check for bad fits by defining a grid of test
+    points and seeing how much they move.  However, for some chips,
+    the region of valid data is much smaller than the regino with any
+    data.  
+
+  * I would like to define a grid (say, Nx * Ny with Nx >> polynomial
+    order) and only use those grid regions in testing the solution
+
+  * This means knowing which detections belong on a specific image.
+    I'm not sure if there is a good way to do this.  at the moment, it
+    is easy to do detection -> image, but not so easy to do
+    image->detection.
+
+  * That might argue for generating the grid for each image, then
+    running through all detections and, as detections are examined,
+    populate the grid elements for their own image.
 
 2010.03.24

branches/eam_branches/ipp-20100621/Ohana/src/relastro/src/load_catalogs.c

@@ -34 +34 @@
       FlagOutliers(&tcatalog);
     }
+
+    // XXX mark the image grid based on the loaded detections
 
     // select only the brighter stars

branches/eam_branches/ipp-20100621/Ohana/src/relastro/src/relastro.c

@@ -49 +49 @@
 
   /* load catalog data from region files : subselect high-quality measurements */
+  // XXX pass in the image table
+  // XXX who carries the image grid?
   catalog = load_catalogs (skylist, &Ncatalog, TRUE);
   MARKTIME("load catalog data: %f sec\n", dtime);

branches/eam_branches/ipp-20100621/psphot/src/Makefile.am

@@ -20 +20 @@
         -$(RM) psphotVersionDefinitions.h
         $(SED) -e "s|@PSPHOT_VERSION@|\"$(PSPHOT_VERSION)\"|" -e "s|@PSPHOT_BRANCH@|\"$(PSPHOT_BRANCH)\"|" -e "s|@PSPHOT_SOURCE@|\"$(PSPHOT_SOURCE)\"|" psphotVersionDefinitions.h.in > psphotVersionDefinitions.h
-# FORCE: ;
+FORCE: ;
 
 libpsphot_la_CFLAGS = $(PSPHOT_CFLAGS) $(PSMODULE_CFLAGS) $(PSLIB_CFLAGS)

branches/eam_branches/ipp-20100621/psphot/src/psphotPSFConvModel.c

@@ -10 +10 @@
 // modelConv to contain the fitted parameters, and the modelFlux to contain the 
 // convolved model image.
-pmModel *psphotPSFConvModel (pmReadout *readout, pmSource *source, pmModelType modelType, psImageMaskType maskVal, psImageMaskType markVal, int psfSize) {
+
+// XXX need to generalize this -- number of fitted parameters must be flexible based on the fitOptions
+
+pmModel *psphotPSFConvModel (pmReadout *readout, pmSource *source, pmSourceFitOptions *fitOptions, pmModelType modelType, psImageMaskType maskVal, psImageMaskType markVal, int psfSize) {
     
     // maskVal is used to test for rejected pixels, and must include markVal