Changeset 24116
- Timestamp:
- May 8, 2009, 12:33:34 PM (17 years ago)
- File:
-
- 1 edited
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trunk/ippconfig/recipes/ppMerge.config (modified) (3 diffs)
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trunk/ippconfig/recipes/ppMerge.config
r23471 r24116 1 1 # Recipe configuration for ppMerge 2 2 3 ROWS S32 128 # Number of rows to read at once 4 ELECTRONS F32 100.0 # Minimum number of electrons for useful signal 5 SAMPLE S32 100000 # Sampling factor for measuring the background 6 REJ F32 3.0 # Rejection threshold (sigma) 7 ITER S32 2 # Number of rejection iterations 8 FRACHIGH F32 0.0 # Fraction of high pixels to reject immediately 9 FRACLOW F32 0.0 # Fraction of low pixels to reject immediately 10 NKEEP S32 5 # Minimum number of pixels in stack to keep 11 VARIANCES BOOL FALSE # Use image variances in combination? 12 FRINGE.NUM S32 10000 # Number of fringe regions 13 FRINGE.SIZE S32 5 # Half-size of fringe regions 14 FRINGE.XSMOOTH S32 5 # Number of smoothing regions in x 15 FRINGE.YSMOOTH S32 11 # Number of smoothing regions in y 16 CTE.MIN F32 0.2 # regions lower than this in the CTE image are masked 17 SHUTTER.SIZE S32 128 # Size for shutter measurement regions 18 MASK.SUSPECT F32 5.0 # Threshold for suspect pixels (sigma) 19 MASK.BAD F32 0.2 # Threshold for bad pixels 20 MASK.MODE STR FRACTION # Mode for identifying bad pixels in the suspect map 21 MASK.CHIPSTATS BOOL TRUE # Measure stats for masking by chip (otherwise by readout)? 22 MASK.GROW S32 0 # Grow bad pixels by this radius 23 MASK.SET.VALUE STR FLAT # set this bit in the output mask 3 ROWS S32 128 # Number of rows to read at once 4 ELECTRONS F32 100.0 # Minimum number of electrons for useful signal 5 SAMPLE S32 100000 # Sampling factor for measuring the background 6 REJ F32 3.0 # Rejection threshold (sigma) 7 ITER S32 2 # Number of rejection iterations 8 FRACHIGH F32 0.0 # Fraction of high pixels to reject immediately 9 FRACLOW F32 0.0 # Fraction of low pixels to reject immediately 10 NKEEP S32 5 # Minimum number of pixels in stack to keep 11 VARIANCES BOOL FALSE # Use image variances in combination? 12 FRINGE.NUM S32 10000 # Number of fringe regions 13 FRINGE.SIZE S32 5 # Half-size of fringe regions 14 FRINGE.XSMOOTH S32 5 # Number of smoothing regions in x 15 FRINGE.YSMOOTH S32 11 # Number of smoothing regions in y 16 CTE.MIN F32 0.2 # regions lower than this in the CTE image are masked 17 SHUTTER.SIZE S32 128 # Size for shutter measurement regions 24 18 25 COMBINE STR CLIPPED# Statistic to use for combination26 MEAN STR ROBUST_MEDIAN# Statistic to use to measure the mean27 STDEV STR ROBUST_STDEV# Statistic to use to measure the stdev19 COMBINE STR CLIPPED # Statistic to use for combination 20 MEAN STR ROBUST_MEDIAN # Statistic to use to measure the mean 21 STDEV STR ROBUST_STDEV # Statistic to use to measure the stdev 28 22 29 MASK.SMOOTH.SUSPECT BOOL TRUE # smooth the suspect-pixel image before making mask 30 MASK.SMOOTH.SCALE F32 3.0 # sigma (pixels) of smoothing kernel 23 MASK.SUSPECT.MODE STR SIGMA # how to identify suspect pixels: SIGMA, VALUE 24 MASK.SUSPECT.MIN F32 -100.0 # for MASK.SUSPECT.MODE == VALUE, below this is suspect 25 MASK.SUSPECT.MAX F32 +100.0 # for MASK.SUSPECT.MODE == VALUE, above this is suspect 26 MASK.SUSPECT.SIGMA F32 5.0 # Threshold for suspect pixels (sigma) 31 27 32 STATS.BY.CHIP BOOL TRUE # measure stats for masking by chip (or by readout) 33 MASK.GROW.NPIX S32 3 # measure stats for masking by chip (or by readout) 28 MASK.SMOOTH.SUSPECT BOOL TRUE # smooth the suspect-pixel image before making mask 29 MASK.SMOOTH.SCALE F32 3.0 # sigma (pixels) of smoothing kernel 30 31 MASK.BAD F32 0.2 # Threshold for bad pixels 32 MASK.MODE STR FRACTION # Mode for identifying bad pixels in the suspect map 33 MASK.CHIPSTATS BOOL TRUE # Measure stats for masking by chip (otherwise by readout)? 34 MASK.GROW S32 0 # Grow bad pixels by this radius 35 MASK.SET.VALUE STR FLAT # set this bit in the output mask 36 37 STATS.BY.CHIP BOOL TRUE # measure stats for masking by chip (or by readout) 38 MASK.GROW.NPIX S32 3 # measure stats for masking by chip (or by readout) 34 39 35 40 # Ordinates for fitting dark current 36 DARK.ORDINATES 37 CELL.DARKTIME S32 1# Traditional dark current term41 DARK.ORDINATES METADATA 42 CELL.DARKTIME S32 1 # Traditional dark current term 38 43 END 39 DARK.NORM STR NONE# Dark normalisation concept44 DARK.NORM STR NONE # Dark normalisation concept 40 45 41 46 # Bias combination --- don't want min/max rejection 42 PPMERGE_BIAS 43 REJ F32 3.0# Rejection threshold (sigma)44 ITER S32 2# Number of rejection iterations45 FRACHIGH F32 0.0# Fraction of high pixels to reject immediately46 FRACLOW F32 0.0# Fraction of low pixels to reject immediately47 VARIANCES BOOL FALSE# Use image variances?48 COMBINE STR CLIPPED# Statistic to use for combination:47 PPMERGE_BIAS METADATA 48 REJ F32 3.0 # Rejection threshold (sigma) 49 ITER S32 2 # Number of rejection iterations 50 FRACHIGH F32 0.0 # Fraction of high pixels to reject immediately 51 FRACLOW F32 0.0 # Fraction of low pixels to reject immediately 52 VARIANCES BOOL FALSE # Use image variances? 53 COMBINE STR CLIPPED # Statistic to use for combination: 49 54 END 50 55 … … 52 57 # Dark combination --- don't want min/max rejection 53 58 # More aggressive clipping than bias, so as to remove CRs 54 PPMERGE_DARK 55 REJ F32 3.0# Rejection threshold (sigma)56 ITER S32 2# Number of rejection iterations57 FRACHIGH F32 0.0# Fraction of high pixels to reject immediately58 FRACLOW F32 0.0# Fraction of low pixels to reject immediately59 VARIANCES BOOL TRUE# Use image variances?60 COMBINE STR CLIPPED# Statistic to use for combination:59 PPMERGE_DARK METADATA 60 REJ F32 3.0 # Rejection threshold (sigma) 61 ITER S32 2 # Number of rejection iterations 62 FRACHIGH F32 0.0 # Fraction of high pixels to reject immediately 63 FRACLOW F32 0.0 # Fraction of low pixels to reject immediately 64 VARIANCES BOOL TRUE # Use image variances? 65 COMBINE STR CLIPPED # Statistic to use for combination: 61 66 END 62 67 63 68 # Flat combination --- use min/max rejection 64 PPMERGE_FLAT 65 REJ F32 3.0# Rejection threshold (sigma)66 ITER S32 1# Number of rejection iterations67 FRACHIGH F32 0.3# Fraction of high pixels to reject immediately68 FRACLOW F32 0.1# Fraction of low pixels to reject immediately69 NKEEP S32 5# Minimum number of pixels in stack to keep70 VARIANCES BOOL TRUE# Use image variances?71 COMBINE STR MEAN# Statistic to use for combination:69 PPMERGE_FLAT METADATA 70 REJ F32 3.0 # Rejection threshold (sigma) 71 ITER S32 1 # Number of rejection iterations 72 FRACHIGH F32 0.3 # Fraction of high pixels to reject immediately 73 FRACLOW F32 0.1 # Fraction of low pixels to reject immediately 74 NKEEP S32 5 # Minimum number of pixels in stack to keep 75 VARIANCES BOOL TRUE # Use image variances? 76 COMBINE STR MEAN # Statistic to use for combination: 72 77 END 73 78 74 79 75 80 # Fringe combination --- already included in default, above 76 PPMERGE_FRINGE 77 FRACHIGH F32 0.1# Fraction of high pixels to reject immediately78 VARIANCES BOOL TRUE# Use image variances?81 PPMERGE_FRINGE METADATA 82 FRACHIGH F32 0.1 # Fraction of high pixels to reject immediately 83 VARIANCES BOOL TRUE # Use image variances? 79 84 END 80 85 81 86 # Mask generation --- already included in default, above 82 87 PPMERGE_DARKMASK METADATA 83 ITER S32 2# Number of iterations84 MASK.BAD F32 0.2# Threshold for bad pixels (sigma)85 MASK.MODE STR FRACTION# Mode for identifying bad pixels in the suspect map86 MASK.SET.VALUE STR DARK# set this bit in the output mask88 ITER S32 2 # Number of iterations 89 MASK.BAD F32 0.2 # Threshold for bad pixels (sigma) 90 MASK.MODE STR FRACTION # Mode for identifying bad pixels in the suspect map 91 MASK.SET.VALUE STR DARK # set this bit in the output mask 87 92 END 88 93 89 94 # Mask generation --- already included in default, above 90 95 PPMERGE_FLATMASK METADATA 91 ITER S32 2# Number of iterations92 MASK.BAD F32 0.2# Threshold for bad pixels (sigma)93 MASK.MODE STR FRACTION# Mode for identifying bad pixels in the suspect map94 MASK.SET.VALUE STR FLAT# set this bit in the output mask96 ITER S32 2 # Number of iterations 97 MASK.BAD F32 0.2 # Threshold for bad pixels (sigma) 98 MASK.MODE STR FRACTION # Mode for identifying bad pixels in the suspect map 99 MASK.SET.VALUE STR FLAT # set this bit in the output mask 95 100 END 96 101 … … 98 103 # but it then sets a mask based on the resulting data values (using CTE.MIN) 99 104 PPMERGE_CTEMASK METADATA 100 REJ F32 3.0# Rejection threshold (sigma)101 ITER S32 2# Number of rejection iterations102 FRACHIGH F32 0.0# Fraction of high pixels to reject immediately103 FRACLOW F32 0.0# Fraction of low pixels to reject immediately104 VARIANCES BOOL FALSE# Use image variances?105 COMBINE STR CLIPPED# Statistic to use for combination:106 CTE.MIN F32 0.2# regions lower than this in the CTE image are masked107 MASK.SET.VALUE STR CTE# set this bit in the output mask105 REJ F32 3.0 # Rejection threshold (sigma) 106 ITER S32 2 # Number of rejection iterations 107 FRACHIGH F32 0.0 # Fraction of high pixels to reject immediately 108 FRACLOW F32 0.0 # Fraction of low pixels to reject immediately 109 VARIANCES BOOL FALSE # Use image variances? 110 COMBINE STR CLIPPED # Statistic to use for combination: 111 CTE.MIN F32 0.2 # regions lower than this in the CTE image are masked 112 MASK.SET.VALUE STR CTE # set this bit in the output mask 108 113 END 109 114 110 115 # Shutter generation --- already included in default, above 111 PPMERGE_SHUTTER 112 REJ F32 2.0# Rejection threshold (sigma)113 ITER S32 1# Number of rejection iterations116 PPMERGE_SHUTTER METADATA 117 REJ F32 2.0 # Rejection threshold (sigma) 118 ITER S32 1 # Number of rejection iterations 114 119 END
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