Changeset 17086

Timestamp:

Mar 20, 2008, 5:25:42 PM (18 years ago)

Author:

Paul Price

Message:

Adding recipe values appropriate to the modernised version of ppMerge.

File:

• branches/pap_branch_080320/ippconfig/recipes/ppMerge.config (modified) (4 diffs)

branches/pap_branch_080320/ippconfig/recipes/ppMerge.config

@@ -3 +3 @@
 ROWS            S32     128             # Number of rows to read at once
 ELECTRONS       F32     100.0           # Minimum number of electrons for useful signal
-SAMPLE          S32     100             # Sampling factor for measuring the background
+SAMPLE          S32     100000          # Sampling factor for measuring the background
 REJ             F32     3.0             # Rejection threshold (sigma)
 ITER            S32     0               # Number of rejection iterations
@@ -18 +18 @@
 SHUTTER.REJECT  F32     2               # Rejection limit for shutter measurement
 MASK.SUSPECT    F32     5.0             # Threshold for suspect pixels (sigma)
-MASK.BAD        F32     4.0             # Threshold for bad pixels (sigma)
-MASK.MODE       STR     POISSON         # Threshold for bad pixels (sigma)
-STATS.BY.CHIP   BOOL    TRUE            # measure stats for masking by chip (or by readout)
-MASK.GROW.NPIX  S32     3               # measure stats for masking by chip (or by readout)
+MASK.BAD        F32     0.2             # Threshold for bad pixels
+MASK.MODE       STR     FRACTION        # Mode for identifying bad pixels in the suspect map
+MASK.CHIPSTATS  BOOL    TRUE            # Measure stats for masking by chip (otherwise by readout)?
+MASK.GROW       S32     0               # Grow bad pixels by this radius
+MASK.GROWVAL    STR     SUSPECT         # Give grown mask pixels this value
 MASKVAL         STR     SAT,BAD         # Mask value for input data
 COMBINE         STR     CLIPPED         # Statistic to use for combination
 MEAN            STR     ROBUST_MEDIAN   # Statistic to use to measure the mean
 STDEV           STR     ROBUST_STDEV    # Statistic to use to measure the stdev
+
+STATS.BY.CHIP   BOOL    TRUE            # measure stats for masking by chip (or by readout)
+MASK.GROW.NPIX  S32     3               # measure stats for masking by chip (or by readout)
 
 # Ordinates for fitting dark current
@@ -47 +51 @@
 # More aggressive clipping than bias, so as to remove CRs
 PPMERGE_DARK    METADATA
-        REJ             F32     2.0             # Rejection threshold (sigma)
-        ITER            S32     4               # Number of rejection iterations
+        REJ             F32     3.0             # Rejection threshold (sigma)
+        ITER            S32     2               # Number of rejection iterations
         FRACHIGH        F32     0.0             # Fraction of high pixels to reject immediately
         FRACLOW         F32     0.0             # Fraction of low pixels to reject immediately
@@ -75 +79 @@
 # Mask generation --- already included in default, above
 PPMERGE_DARKMASK METADATA
-  MASK.BAD       F32    3.0             # Threshold for bad pixels (sigma)
-  MASK.MODE      STR    VALUE           # Threshold for bad pixels (sigma)
+        ITER            S32     2               # Number of iterations
+        MASK.BAD        F32     3.0             # Threshold for bad pixels (sigma)
+        MASK.MODE       STR     VALUE           # Mode for identifying bad pixels in the suspect map
 END
 
 # Mask generation --- already included in default, above
 PPMERGE_FLATMASK METADATA
-  MASK.BAD       F32    3.0             # Threshold for bad pixels (sigma)
-  MASK.MODE      STR    VALUE           # Threshold for bad pixels (sigma)
+        ITER            S32     2               # Number of iterations
+        MASK.BAD        F32     3.0             # Threshold for bad pixels (sigma)
+        MASK.MODE       STR     VALUE           # Mode for identifying bad pixels in the suspect map
 END